{"id":2453,"date":"2026-06-30T16:19:19","date_gmt":"2026-06-30T16:19:19","guid":{"rendered":"https:\/\/maydomau.vn\/may-quang-pho-do-mau-de-ban-3nh-ts8280-single-aperture-de-ab-0-05\/"},"modified":"2026-06-30T16:22:50","modified_gmt":"2026-06-30T16:22:50","slug":"3nh-ts8280-benchtop-spectrophotometer-single-aperture-de-ab-0-05","status":"publish","type":"product","link":"https:\/\/maydomau.vn\/en\/san-pham\/3nh-ts8280-benchtop-spectrophotometer-single-aperture-de-ab-0-05\/","title":{"rendered":"3nh TS8280 Benchtop Spectrophotometer (Single aperture; \u0394E*ab 0.05)"},"content":{"rendered":"

3nh TS8280 Benchtop Spectrophotometer (Single aperture; \u0394E*ab 0.05)<\/strong><\/h2>\n

In material manufacturing and processing industries, consistent color across production batches is the core criterion for evaluating product quality. Unlike handheld devices which are often affected by user handling or measuring head flushness, a fixed benchtop system provides absolute stability and reliability for the laboratory. The 3nh TS8280 benchtop spectrophotometer emerges as the ideal quality control standardization solution \u2013 a dedicated benchtop instrument boasting a repeatability error Delta E*ab of just 0.05, helping businesses digitize and manage colors in the most scientific and transparent way.<\/p>\n

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Overview of 3nh TS8280 Benchtop Spectrophotometer<\/strong><\/h2>\n

The 3nh TS8280 is a professionally designed benchtop spectrophotometer utilizing the international standard d\/8 optical geometry with an integrated diffusing sphere system (diffuse illumination, 8-degree viewing angle). The device fully and strictly complies with the regulations of the International Commission on Illumination (CIE No.15), ISO 7724\/1, ASTM E1164, and DIN 5033.<\/p>\n

The core power that allows the TS8280 to achieve outstanding stability lies in its optical grating light-splitting technology combined with a high-resolution dual-array CMOS spectral matrix sensor system. The instrument smoothly separates visible light energy across the 400nm to 700nm wavelength range, delivering measurement results with an excellent repeatability error Delta E*ab below 0.05, ensuring perfect data consistency between measurements.<\/p>\n

Key Features of 3nh TS8280<\/strong><\/h2>\n

\ud83d\udca1 High Laboratory-Grade Precision (Delta E*ab of just 0.05)<\/strong><\/p>\n

With an exceptionally low measurement error (Delta E*ab below 0.05), the TS8280 delivers ultra-fine color spectrum analysis capabilities comparable to high-end Master instruments. The smart optical system features automatic temperature compensation and completely eliminates interference from external stray light in the workshop environment, ensuring absolute data stability over tens of thousands of continuous operations.<\/p>\n

\ud83d\udca1 Stable Standard Fixed Measuring Aperture (Single Aperture)<\/strong><\/p>\n

The TS8280 is equipped with a standard fixed flat measuring aperture (typically a \u00d88mm or \u00d810mm configuration depending on the selected version). Utilizing a single aperture optimizes the internal optical chamber, eliminating mechanical errors caused by switching apertures, and ensuring the most ideal repeatability when testing standard flat material samples.<\/p>\n

\ud83d\udca1 Comprehensive Measurement of Both SCI and SCE Modes<\/strong><\/p>\n

The premium optical system of the instrument allows for deep analysis of material surface characteristics through two measurement modes:<\/p>\n