{"id":3774,"date":"2026-07-20T17:18:44","date_gmt":"2026-07-20T17:18:44","guid":{"rendered":"https:\/\/maydomau.vn\/san-pham\/may-quang-pho-de-ban-chn-spec-cs-820p-d-8-de-ab-0-02-360nm-780nm\/"},"modified":"2026-07-20T17:22:31","modified_gmt":"2026-07-20T17:22:31","slug":"chn-spec-cs-820p-benchtop-spectrophotometer-d-8-de-ab-0-02-360nm-780nm","status":"publish","type":"product","link":"https:\/\/maydomau.vn\/en\/san-pham\/chn-spec-cs-820p-benchtop-spectrophotometer-d-8-de-ab-0-02-360nm-780nm\/","title":{"rendered":"CHN SPEC CS-820P Benchtop Spectrophotometer (d\/8, \u0394E*ab\u22640.02, 360nm-780nm)"},"content":{"rendered":"

CHN SPEC CS-820P Benchtop Spectrophotometer (d\/8, \u0394E*ab\u22640.02, 360nm-780nm)<\/strong><\/h2>\n

The CHNSpec CS-820P Benchtop Spectrophotometer is an intelligent and comprehensive color analysis device, designed to meet the highest standards in research and development (R&D) laboratories and quality control (QC) processes. The combination of high accuracy, wide wavelength range, and the ability to measure various physical states makes the CS-820P an excellent analytical solution with a highly reasonable investment cost.<\/p>\n

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Technical Specifications:<\/strong><\/h2>\n

Illumination \/ Observation System:<\/p>\n

Reflectance: d\/8 (diffuse illumination, 8\u00b0 viewing angle), Transmittance: d\/0 (diffuse illumination, 0\u00b0 viewing angle);<\/p>\n

Simultaneous measurement of SCI (Specular Component Included) \/ SCE (Specular Component Excluded);<\/p>\n

Compliance Standards: CIE No.15, GB\/T 3978, GB 2893, GB\/T 18833, ISO 7724\/1, DIN 5033 Teil 7, JIS Z8722 Condition C, ASTM E1164, ASTM D1003-07<\/p>\n

Sensor: Silicon photodiode<\/p>\n

Grating Method: Concave grating<\/p>\n

Integrating Sphere Diameter: 152mm<\/p>\n

Wavelength Range: 360nm-780nm<\/p>\n

Wavelength Interval: 10nm<\/p>\n

Spectral Half-width: 1nm<\/p>\n

Reflectance Range, Resolution: 0-200%, 0.01%<\/p>\n

Light Source: Xenon lamp & LED<\/p>\n

UV Measurement: UV included, 400nm cut, 420nm cut, 460nm cut<\/p>\n

Measurement Time: SCI\/SCE < 2s; SCI+SCE < 4s<\/p>\n

Measurement\/Illumination Aperture:<\/p>\n

Reflectance:<\/p>\n

XLAV: \u03a625.4mm \/ \u03a630mm<\/p>\n

LAV: \u03a615mm \/ \u03a618mm<\/p>\n

MAV: \u03a68mm \/ \u03a611mm<\/p>\n

SAV: \u03a63mm \/ \u03a66mm<\/p>\n

Users can customize apertures, the device automatically recognizes when switching apertures<\/p>\n

Transmittance: \u03a617mm \/ \u03a625mm<\/p>\n

Sample Size: Unlimited sample width and height, thickness \u226450mm<\/p>\n

Long-term Repeatability: \/<\/p>\n

Repeatability: XLAV Spectral Reflectance \/ Transmittance: Standard deviation within 0.1%; XLAV Chromaticity Value: Standard deviation within \u0394E*ab 0.02 (When a white tile is measured 30 times at 5-second intervals after white calibration)<\/p>\n

Inter-instrument Agreement: XLAV \u0394E*ab 0.25 (BCRA Series II, Average measurement of 12 tiles, at 23\u2103)<\/p>\n

Observer Angles: 2\u00b0, 10\u00b0<\/p>\n

Illuminants: A, C, D50, D55, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, CWF, U30, DLF, NBF, TL83, TL84<\/p>\n

Languages: Simplified Chinese, Spanish, Portuguese<\/p>\n

Display: Spectral graph\/values for reflectance and transmittance, color values, color difference values, Pass\/Fail, color simulation, color assessment, opacity, liquid chromaticity values, color trend<\/p>\n

Color Spaces: L*a*b, L*C*h, Hunter Lab, Yxy, XYZ<\/p>\n

Other Indices:<\/p>\n

WI (ASTM E313-00, ASTM E313-73, CIE\/ISO, AATCC, Hunter, Taube, Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Tint (ASTM E313-00), Metamerism index milm, Stain fastness, Color fastness, ISO brightness, R457, A density, T density, E density, M Density, APHA\/Hazen\/Pt-Co, Gardner index, Saybolt index, ASTM color, Opacity, Total Transmittance, Hiding power, Color Strength<\/p>\n

Color Difference Formulas: \u0394E*ab, \u0394E*CH, \u0394E*uv, \u0394E*cmc, \u0394E*94, \u0394E*00, \u0394E*ab(hunter), 555 shade sort<\/p>\n

Storage: 8GB<\/p>\n

Screen: 7-inch touch screen<\/p>\n

Operating System: Android<\/p>\n

Adapter: Regulated DC power supply<\/p>\n

Working Temperature: 5-40\u2103 (40-104F), relative humidity 80% (35\u2103) non-condensing<\/p>\n

Storage Temperature: -20-45\u2103 (-4-113F), relative humidity 80% (35\u2103) non-condensing<\/p>\n

Standard Accessories: Power adapter, data cable, transmittance fixture, USB flash disk (software), black calibration cavity, white board, green board, 0% calibration shade (included with 820N), 30mm aperture plate, 18mm aperture plate, 11mm aperture plate, 6mm aperture plate, support table, cuvette, damping handle<\/p>\n

Optional Accessories: Heating transmittance fixture (including control circuit), vertical support, pneumatic push rod (including control circuit), small sample fixture, trolley case, European standard plug, American standard plug, reflectance cuvette support, corrosion-resistant protective plate (non-removable), fiber test box, film fixture, and micro transmittance fixture<\/p>\n

Interface: RS-232, USB, USB-B<\/p>\n

Other Functions:<\/p>\n

1. Camera viewfinder positioning;<\/p>\n

2. The device can measure horizontally, upwards, and downwards (using accessories);<\/p>\n

3. Automatic temperature and humidity compensation function<\/p>\n

Outstanding Features<\/strong><\/h2>\n

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Multi-State Measurement (Reflectance & Transmittance):<\/strong> The CS-820P features a large-sized sample measurement chamber, allowing the device to accurately measure not only solid, opaque materials (reflectance) but also perfectly analyze transparent, semi-transparent materials, and liquids (transmittance).<\/p>\n

High Accuracy and Repeatability:<\/strong> With a very low repeatability error margin (\u0394E*ab \u2264 0.02), the device provides highly stable and reliable color data. This is especially important for evaluating color deviation between product batches and building a standard color database for the factory.<\/p>\n

Simultaneous SCI and SCE Acquisition:<\/strong> The advanced optical system can simultaneously acquire SCI data (true color, used for color matching) and SCE data (visually perceived color, affected by surface gloss) in a single measurement operation, optimizing time and providing a comprehensive view of material characteristics.<\/p>\n

Accurate Analysis of Fluorescent Materials:<\/strong> Equipped with a full-band pulsed Xenon light source integrated with UV, the CS-820P excellently handles samples containing optical brightening agents (OBA) or luminescent materials, ensuring unbiased results.<\/p>\n

Automatic Calibration and Dual Optical Path:<\/strong> Smart compensation technology combined with a dual optical system helps the device continuously monitor changes in the light source and environment (temperature, humidity), automatically adjusting to maintain the most ideal measurement state.<\/p>\n

Common Applications<\/strong><\/h2>\n

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The flexible switching capability between reflectance and transmittance measurement helps the CHNSpec CS-820P shine in many industries:<\/p>\n